Article | REF: E2460 V2

Test of integrated digital circuits - Basic notions and evolutions

Authors: Mounir BENABDENBI, Régis LEVEUGLE

Publication date: September 10, 2021, Review date: September 14, 2021

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2. Test vectors, fault models and coverage rates

2.1 Vectors and test sequences

Figure 1 schematizes the application principle of testing a circuit, or a block within a circuit; values are applied to the inputs, and the results obtained on the outputs are compared with predetermined values. This corresponds respectively to an input vector V a (stimuli) and an output vector V s (reference). A test vector is composed of these two vectors: V = (V a .V s ). The V a vectors are determined to enable the various faults we...

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Test vectors, fault models and coverage rates