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6. Conclusion
Integrated circuit testing is constantly evolving. Techniques are still based on basic methods and concepts (modeling, vector generation algorithms), but each time they must take into account the characteristics of the circuits under test: which technology? which material? for which application? Today, despite the nanometric dimensions of transistors, it is possible to achieve very low defect rates (less than ten ppm).
Generating an effective test program is a fundamental task for today's designers. The choice of fault models considered and the test strategies implemented have a profound influence on the quality of the product delivered to customers.
It is therefore very important today that designers are trained to be able to implement Design for Test (DFT) techniques. These techniques are presented in greater detail in the article...
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Acronyms
Bibliography
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Conferences
Many journals, symposia and conferences in the field of circuit design have sessions devoted to testing and may be of interest to supplement the information given in this article.
International test conference (ITC) (United States)
VLSI test symposium (VTS) (United States)
European test symposium (ETS) (Europe)
Design automation...
Standards and norms
IEEE 1149 standard, also known as the Boundary Scan standard, for testing board-based systems, https://standards.ieee.org/
ISO 26262 standard for vehicle functional safety,
RTCA DO 254 standard for functional safety in aeronautics,
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