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5. Developments and challenges for testing
Over the last two decades, the implementation of the basic techniques and concepts presented above has come up against a number of constraints, mainly due to the continuing reduction in transistor sizes, but also to the emergence of new materials and new design practices. Maintaining a high level of reliability in the circuits we produce now requires us to adapt our test techniques for integration in more numerous, more varied and more demanding applications. The most significant problems encountered and some of the solutions found are briefly described below. For further information, please refer to the articles referenced in the bibliography section.
5.1 Manufacturing variability: impacts on design and production testing
Technological advances in recent...
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Developments and challenges for testing
Conclusion
Bibliography
Paragraphs 1 to 4
Conferences
Many journals, symposia and conferences in the field of circuit design have sessions devoted to testing and may be of interest to supplement the information given in this article.
International test conference (ITC) (United States)
VLSI test symposium (VTS) (United States)
European test symposium (ETS) (Europe)
Design automation...
Standards and norms
IEEE 1149 standard, also known as the Boundary Scan standard, for testing board-based systems, https://standards.ieee.org/
ISO 26262 standard for vehicle functional safety,
RTCA DO 254 standard for functional safety in aeronautics,
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