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The Ultimate Scientific and Technical Reference
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Bibliography
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Conferences
Many journals, symposia and conferences in the field of circuit design have sessions devoted to testing and may be of interest to supplement the information given in this article.
International test conference (ITC) (United States)
VLSI test symposium (VTS) (United States)
European test symposium (ETS) (Europe)
Design automation...
Standards and norms
IEEE 1149 standard, also known as the Boundary Scan standard, for testing board-based systems, https://standards.ieee.org/
ISO 26262 standard for vehicle functional safety,
RTCA DO 254 standard for functional safety in aeronautics,
Directory
Foundries: integrated circuit manufacturers (non-exhaustive list)
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Samsung Electronics
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The Ultimate Scientific and Technical Reference
