1. Images and contrasts
The scanning electron microscope is mainly used to obtain images of the sample surface. These images are formed mainly by surface electron emissions (secondary and backscattered electrons). Different contrasts can be observed, providing a wide range of information about the sample, essentially about its relief (topographic contrast), but also about the distribution of the phases present ("atomic number" contrast using backscattered electrons). Other contrasts can also be observed, depending on the case, in particular chemical contrasts (presence and distribution of chemical elements) and crystalline contrasts (crystallographic structure and texture). Scanning electron microscopy can also provide precise local chemical analysis, which can even be quantitative if the sample permits (electron probe microanalysis).
Contrast represents the relative signal variation between...
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Images and contrasts
Events
GNMEBA holds two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and a summer school every 5-6 years (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
- Microbeam analysis – scanning electron microscopy : – TC202/SC1: terminology – TC202/SC2: microanalysis by electron probe – TC202/SC4: scanning electron microscopy – TC202/WG4: energy-selective spectrometry - ISO TC202 -
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
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Electronic microwaves
CAMECA http://www.cameca.com
Jeol (Jeol Europe SA) http://www.jeol.com/
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