4. New developments in scanning electron microscopy
In recent years, steady progress has been made in the design and manufacture of scanning electron microscopes:
to improve spatial resolution by reducing electron lens aberrations, improving detector efficiency and enhancing electron gun brilliance while reducing costs;
to adapt its use to the electronic components industry: appropriate "object" chambers, optimized low-voltage operation;
to facilitate management through computerization;
to integrate the digitization of acquired images right from the design stage.
More recently, new applications have been developed using special equipment:
automatic, methodical use of electron backscatter diffraction (EBSD);...
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New developments in scanning electron microscopy
Applications
Events
GNMEBA holds two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and a summer school every 5-6 years (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
- Microbeam analysis – scanning electron microscopy : – TC202/SC1: terminology – TC202/SC2: microanalysis by electron probe – TC202/SC4: scanning electron microscopy – TC202/WG4: energy-selective spectrometry - ISO TC202 -
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
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Electronic microwaves
CAMECA http://www.cameca.com
Jeol (Jeol Europe SA) http://www.jeol.com/
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