5. Applications
5.1 Materials engineering
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Observation of microstructures
Scanning electron microscopy routinely enables high magnification observation of the microstructures of materials prepared by polishing and appropriate etching. In most cases, metallographic etching hollows out grain boundaries and phase interfaces and/or dissolves each phase differently, thus creating a significant micro-relief that can be easily observed with secondary electron imaging. In this case, it complements optical microscopy to distinguish microstructural constituents in great detail (figure 35 ).
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Events
GNMEBA holds two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and a summer school every 5-6 years (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
- Microbeam analysis – scanning electron microscopy : – TC202/SC1: terminology – TC202/SC2: microanalysis by electron probe – TC202/SC4: scanning electron microscopy – TC202/WG4: energy-selective spectrometry - ISO TC202 -
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Electronic microwaves
CAMECA http://www.cameca.com
Jeol (Jeol Europe SA) http://www.jeol.com/
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