Article | REF: P866 V2

Scanning electron microscopy -Images, applications and developments

Author: Jacky RUSTE

Publication date: March 10, 2013, Review date: June 1, 2017

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

7. Outlook

While scanning electron microscopy underwent little development for some thirty years, it has undergone considerable change since the 1990s, in particular with high-resolution, variable-pressure microscopes and double-column microscopes.

Scanning ion microscope (Zeiss Orion model)
Figure 42  -  Scanning ion microscope (Zeiss Orion model)

It is likely...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Analysis and Characterization

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Outlook