10. Thanks
The authors warmly thank Jean-Christophe Peyrard (DGA) and Joël Deschamps (retired ONERA) for their careful proof-reading.
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Optics and photonics
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Thanks
Bibliography
Bibliography
Standards and norms
- « Standard for Characterization of Image Sensors and Cameras » - EMVA 1288 -
Patents
WHITE (A.). – Infrared detectors, US Patent 4 679 063 (September 22, 1983).
McKENZIE (T.K.C.), BORNFREUND (R.E.), LEONARD (D.) and CARLSON (G.A.) (2018). – US Patent no. 10, 153, 204. Washington, DC: US Patent and Trademark Office.
Directory
Manufacturers – Suppliers – Distributors of infrared matrix detectors (non-exhaustive list)
AIM https://www.aim-ir.com/en/home.html
Chunghwa https://www.clpt.com.tw/
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference