1. Infrared: from source to detector
First of all, let's clarify what we mean by "infrared". The definition of this spectral range can vary widely from one scientific community to another. In this article, we focus on wavelengths greater than 1 μm, i.e. beyond the sensitivity range of silicon, and limit ourselves to 14 μm as an upper limit. This spectral range is subdivided into several atmospheric transmission windows:
SWIR (Short-Wave InfraRed) between 1 and 2.5 μm ;
MWIR (Mid-Wave InfraRed) between 3 and 5 μm ;
LWIR (Long-Wave InfraRed) between 8 and 14 μm (figure 1 ).
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Infrared: from source to detector
Bibliography
Bibliography
Standards and norms
- « Standard for Characterization of Image Sensors and Cameras » - EMVA 1288 -
Patents
WHITE (A.). – Infrared detectors, US Patent 4 679 063 (September 22, 1983).
McKENZIE (T.K.C.), BORNFREUND (R.E.), LEONARD (D.) and CARLSON (G.A.) (2018). – US Patent no. 10, 153, 204. Washington, DC: US Patent and Trademark Office.
Directory
Manufacturers – Suppliers – Distributors of infrared matrix detectors (non-exhaustive list)
AIM https://www.aim-ir.com/en/home.html
Chunghwa https://www.clpt.com.tw/
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