6. Overview of existing channels
As we have seen in this article, there are many different types of infrared detectors. In this section, we present a summary of the commercially available matrix-format dies. The aim here is not to highlight one type of detector over another, since we have seen that to make a choice, it is necessary to take into account the intended application and carry out a dedicated performance assessment. It is therefore not possible to draw any general conclusions about the merits of any particular process. We therefore confine ourselves to factually reporting the characteristics of existing components.
The InGaAs die covers part of the SWIR window with a cut-off wavelength of 1.7 μm, which allows operation at room temperature, which is obviously an advantage. Today, megapixel arrays with a 10 μm pitch are available worldwide. Conventional components detect between 0.9 and...
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Overview of existing channels
Bibliography
Bibliography
Standards and norms
- « Standard for Characterization of Image Sensors and Cameras » - EMVA 1288 -
Patents
WHITE (A.). – Infrared detectors, US Patent 4 679 063 (September 22, 1983).
McKENZIE (T.K.C.), BORNFREUND (R.E.), LEONARD (D.) and CARLSON (G.A.) (2018). – US Patent no. 10, 153, 204. Washington, DC: US Patent and Trademark Office.
Directory
Manufacturers – Suppliers – Distributors of infrared matrix detectors (non-exhaustive list)
AIM https://www.aim-ir.com/en/home.html
Chunghwa https://www.clpt.com.tw/
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