Article | REF: R6491 V1

Ellipsometry - Instrumentation and applications

Authors: Frank BERNOUX, Jean-Philippe PIEL, Bernard CASTELLON, Christophe DEFRANOUX, Jean-Hervé LECAT, Pierre BOHER, Jean-Louis STEHLÉ

Publication date: June 10, 2003

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2. Extensions

2.1 Infrared ellipsometry

  • Presentation

    Infrared spectroscopic ellipsometry is of great interest because materials in this spectral range behave very differently from those in the visible range:

    • dielectrics display molecular vibration bands, the signature of the molecules making up these layers. These vibrational bands are modeled by one or more harmonic oscillators whose amplitudes give access to the concentrations of the species present in the layer;

    • most semiconductors are transparent;

    • metals and doped semiconductors show a characteristic increase in extinction coefficient with wavelength. This behavior is modeled by...

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