Français
1. Principle
Observing the micro-relief of a surface is impossible at high magnification with a conventional ("photonic") optical microscope. This is because the separating power (or lateral spatial resolution) is limited to around 0.2 μm and, at maximum magnification of 1,500, the depth of field is limited to around 1 μm. Both depend on the wavelength of the visible radiation and the numerical aperture of the beam, and cannot be improved. This is why the idea of imaging a sample from :
or a beam of electrons sufficiently accelerated for the associated wavelength to be less than a nanometer (transmission electron microscopy, generally referred to as TEM);
or a very fine, almost parallel brush of electrons that sweeps across the sample, using the secondary electrons emitted to form a point-by-point image (scanning electron...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Principle
A reminder of electron-matter interactions
Bibliography
Events
GNMEBA: two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and every 5-6 years a summer school (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS: European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
ISO TC202 Microbeam analysis – scanning electron microscopy :
TC202/SC1: terminology
TC202/SC2: microanalysis by electron probe
TC202/SC4: scanning electron microscopy.
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Scanning electron microscopes
Carl Zeiss SMT http://microscopy.zeiss.com/microscopy/en_de/home.html
FEI Company (FEI France, formerly Philips Optique Électronique)
The Ultimate Scientific and Technical Reference
