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4. Conclusion
For many years, scanning electron microscopy saw few major upheavals, but the development over the last fifteen years of field emission guns (mainly Schottky emission) has changed the technique considerably. The development of new electronic column concepts and new detectors has extended the capabilities of these microscopes, particularly in terms of imaging resolution, but also in terms of observation capabilities at low and very low voltages. On the other hand, contrast interpretation has often become more complicated, as secondary and backscattered electronic emissions at low voltages no longer follow the same rules as at higher voltages (see
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Conclusion
Bibliography
Events
GNMEBA: two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and every 5-6 years a summer school (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS: European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
ISO TC202 Microbeam analysis – scanning electron microscopy :
TC202/SC1: terminology
TC202/SC2: microanalysis by electron probe
TC202/SC4: scanning electron microscopy.
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Scanning electron microscopes
Carl Zeiss SMT http://microscopy.zeiss.com/microscopy/en_de/home.html
FEI Company (FEI France, formerly Philips Optique Électronique)
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