2. A reminder of electron-matter interactions
When an electron beam of energy E 0 penetrates a solid sample, it undergoes a number of interactions, both elastic and inelastic. Inelastic interactions cause a progressive loss of its energy, largely through transfer to electrons in atomic orbitals and to a lesser extent through radiative loss during interaction with the nucleus (braking radiation still often called Bremsstrahlung following the historical German term). Elastic interactions, mainly with the nucleus, also induce more or less abrupt variations in the direction of incident electrons ("scattering"). The result of these interactions is an "electron trajectory" for each electron, of finite length and random shape.
Numerical simulation, using a Monte Carlo method which models the random collisions of the incident electron with the target atoms, allows us to...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
A reminder of electron-matter interactions
Instrument
Bibliography
Events
GNMEBA: two annual meetings, a thematic meeting in spring and a pedagogical meeting in December in Paris, and every 5-6 years a summer school (the last one took place in 2012 in Lille). http://www.gn.meba.org
EMAS: European congress every 2 years and a regional symposium every 2 years in alternation
Standards and norms
ISO TC202 Microbeam analysis – scanning electron microscopy :
TC202/SC1: terminology
TC202/SC2: microanalysis by electron probe
TC202/SC4: scanning electron microscopy.
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Scanning electron microscopes
Carl Zeiss SMT http://microscopy.zeiss.com/microscopy/en_de/home.html
FEI Company (FEI France, formerly Philips Optique Électronique)
The Ultimate Scientific and Technical Reference
