Overview
FrançaisABSTRACT
This article, which is Part one of a study concerning EMC testing methods, focuses on a frequency range from 150 kHz to 1 GHz. Measurements of EM wide frequency range emissions collected in the vicinity of electronic equipment and immunity tests are successively addressed. A second section deals with the features of receiving antennas such as electric monopoles and magnetic loops used at low frequencies below 30 MHz.
Read this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.
Read the articleAUTHOR
-
Bernard DÉMOULIN: Professor Emeritus - Lille 1 University, IEMN TELICE Group, CNRS, UMR 8520
INTRODUCTION
Electromagnetic compatibility metrology, succinctly referred to as "EMC metrology", covers such a varied field of application that it would be illusory to detail its content in the space of a single article. For these reasons, the author has decided to limit his presentation to the evaluation of the electromagnetic emission or immunity of an electronic device, and to the measurement of radiofrequency waves carrying weak or strong fields.
In terms of official terminology, emission refers to undesirable electromagnetic fields radiated at a distance from a device and capable of causing interference that could alter the operation of a neighboring device.
Conversely, a device's immunity characterizes its ability to function unaltered in the presence of electromagnetic fields of a frequency range and intensity predefined by a test protocol.
The subject will be developed in two distinct parts, comprising two articles linked by common physical properties.
The first part of the text, entitled "General description", covers the protocols for emission measurements and electromagnetic immunity tests, as well as the receiving antennas used for low-frequency measurements.
The second part of the article
Let's go back to the first part and briefly describe the first paragraph. First of all, we'll define what constitutes a device undergoing emission or immunity testing. The presentation will focus on the physical nature of the variables involved in EMC metrology, and then on the division of the spectrum into three frequency ranges: low frequencies from 150 kHz to 30 MHz, high frequencies from 100 MHz to 1 GHz, and intermediate frequencies bridging the gap from 30 MHz to 100 MHz. As we shall see from the examples, this division of the spectrum is not arbitrary, but is justified by the properties of broadband antennas and the nature of the variables required for measurement or testing. Measurement and test protocols generally used in semi-anechoic chambers will also be examined, to highlight various sources of uncertainty.
In the second section, we analyze the operation of receiver antennas used in some transmitter measurements between...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
KEYWORDS
measurements | Electromagnetic compatibility (EMC) | testing methods | monopole antenna | loop antenna | immunity | susceptibility
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Physical framework for electromagnetic compatibility metrology
Bibliography
Events
International French-language symposium on EMC, biennial event. Last edition, July 10 to 13, 2016, Rennes.
EMC Europe symposia annual meeting on EMC in European Area. Last meeting, Sept. 5-9, 2016, Wroclaw (Poland).
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference