Overview
FrançaisABSTRACT
The tomographic atom probe SAT meets the growing needs of analysis and imaging in nanotechnology. It allows for sample imaging, atom by atom, in the three spatial dimensions, with a sub-nanometer resolution. It is a widely used process: over 70 academic and industrial laboratories are equipped with its commercial version and use it on a daily basis. Other means of characterization, such as the high-resolution electron microscope or the SIMS, which, although powerful, are limited to two dimensions, are often associated with them. In this article, the principle of the laser atom probe is presented and examples of practical application in nanotechnology are provided.
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Read the articleAUTHORS
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Didier BLAVETTE: Professeur des Universités Groupe de Physique des Matériaux – UMR CNRS 6634 Normandie Université, Université et INSA de Rouen UFR Sciences et Techniques
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François VURPILLOT: Senior Lecturer, Materials Physics Group – UMR CNRS 6634 Normandie Université, Université et INSA de Rouen UFR Sciences et Techniques
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Bernard DECONIHOUT: Professeur des Universités Groupe de Physique des Matériaux – UMR CNRS 6634 Normandie Université, Université et INSA de Rouen UFR Sciences et Techniques
INTRODUCTION
The constant progress made in nanoscience and its applications, nanotechnology, has only been possible thanks to the development of increasingly powerful analysis and imaging techniques. For a long time, nanostructures such as transistors, spin valves and LEDs were structured in two dimensions in increasing density on silicon substrates (wafers). Today, the nanoelectronics industry is faced with a major obstacle to the surface integration of nano-objects. A step forward has just been taken this year, 2013, with INTEL's launch of 3D technology, without which integration density can no longer grow. While two-dimensional analysis and imaging techniques are legion (secondary ion mass spectrometry, high-resolution electron microscopy, near-field techniques...), none, until the advent of the laser-assisted tomographic atom probe, made it possible to study the interfaces and chemistry of these new nano-objects on an atomic scale and in three dimensions.
The atomic probe is a fairly old instrument, born three times over. For a long time, it was limited to the study of metals. It has recently undergone a revolution, enabling it to be used on insulating and conducting materials. This has paved the way for 3D analytical imaging with sub-nanometer resolution.
This article describes the fundamental principles on which the technique is based, and the technologies developed over the last few years to produce the modern version of the instrument, following a number of ingenious developments in the field of nanoscience. Today, it is in the field of nanotechnology that the SAT tomographic atomic probe continues to be developed and to find varied applications on modern problems.
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KEYWORDS
field evaporation | time of flight mass spectrometry | 3D reconstruction | ultrafast laserpulses | time resolved position sensitive detection
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Atomic tomographic probe SAT
Bibliography
Patents
Atomic Tomographic Wide Angle Laser Probe with very high mass resolution, BOSTEL Alain , DECONIHOUT Bernard , YAVOR Mickael , RENAUD ludovic, Date de dépôt 12/10/2007 Numero INIST 07 07178
Wide Angle Atomic Tomographic Probe with evaporation assisted by a "white" femtosecond laser pulse, DECONIHOUT Bernard, VELLA Angela, Francois Vurpillot, BREVET INTERNATIONAL n WO/2010/000574 Application number int:...
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