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4. Architectures and methods for testing complex systems
4.1 Issues
The evolution of fault models for recent technologies was presented in the article
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Architectures and methods for testing complex systems
Design techniques for online testability
Bibliography
Conferences
Many journals, symposia and conferences in the field of circuit design offer sessions devoted to testing and may be of interest to supplement the information provided in this article:
International test conference (ITC) (United States) ;
VLSI test symposium (VTS) (United States) ;
European test symposium (ETS)...
Standards and norms
Readers can access detailed information on the various standards via the official website :
In order of appearance in the article:
IEEE 1149.1 standard and BSDL language (Boundary Scan Description Language)
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Directory
Foundries: integrated circuit manufacturers (non-exhaustive list)
TSMC: http://www.tsmc.com
Samsung : Electronics http://www.samsungfoundry.com
Global Foundries : http://www.globalfoundries.com
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