5. Conclusions and outlook
This article, supported by the previous one
Progress in SOI, leading to transistors well under 10 nm thick, has been breathtaking. French researchers and engineers have distinguished themselves in the discovery and development of Smart-Cut material and integration processes, as well as in the understanding...
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Conclusions and outlook
Bibliography
Websites
Events
EUROSOI-ULIS: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
https://eurosoiulis2019.sciencesconf.org
ESSDERC-ESSCIRC: European Solid-State Device Research Conference & European Solid-State Circuits Conference
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