Article | REF: R310 V1

Background noise and measurements - Theoretical aspects

Authors: Matteo VALENZA, Fabien PASCAL, Alain HOFFMANN

Publication date: December 10, 2006

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AUTHORS

 INTRODUCTION

Note :

(This is a revision of dossier R 310 written by Michel SAVELLI, José COMALLONGA and Laurent BOGGIANO)

The performance of electronic systems is increasingly limited by the noise behavior of their components, both passive and active. It's important for designers to have as accurate an assessment as possible of the background noise of components, and to be familiar with existing measurement techniques and simulation models.

That's why we've focused this dossier and the next one on on four key objectives.

The first objective of this dossier is to quickly clarify the mathematical formalism and, from a theoretical point of view, the physical origin of the main sources of background noise, as well as how these sources are characterized within the framework of circuit theory.

The other three objectives will be developed in the dossier .

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Background noise and measurements