Overview
Read this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.
Read the articleAUTHORS
-
Matteo VALENZA: Professor at the University of Montpellier II
-
Fabien PASCAL: Professor at the University of Montpellier II
-
Alain HOFFMANN: Professor at the University of Montpellier II
INTRODUCTION
(This is a revision of dossier R 310 written by Michel SAVELLI, José COMALLONGA and Laurent BOGGIANO)
The performance of electronic systems is increasingly limited by the noise behavior of their components, both passive and active. It's important for designers to have as accurate an assessment as possible of the background noise of components, and to be familiar with existing measurement techniques and simulation models.
That's why we've focused this dossier and the next one on on four key objectives.
The first objective of this dossier is to quickly clarify the mathematical formalism and, from a theoretical point of view, the physical origin of the main sources of background noise, as well as how these sources are characterized within the framework of circuit theory.
The other three objectives will be developed in the dossier .
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Background noise and measurements