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Article | REF: R310 V1

Background noise and measurements - Theoretical aspects

Authors: Matteo VALENZA, Fabien PASCAL, Alain HOFFMANN

Publication date: December 10, 2006

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2. Main components of background noise

2.1 Microscopic approach to fluctuations

Consider a homogeneous semiconductor bar, of length L measured along the Ox axis, with two ohmic contacts (electrodes) at its ends, of type N + , so that the hole population can be neglected.

Let us denote by q the electron charge, n the electron density, the current density...

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Main components of background noise
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