Français
4. Metrological atomic force microscope
At the nanometer scale, the metrological atomic force microscope is the means of connecting dimensional measurements to the International System of Units. It acts as a link between the users of near-field microscopes at the base of the traceability pyramid and the unit of length at the top of the pyramid. It is a measuring instrument dedicated to the calibration of transfer standards used in the field of nanoscience and nanotechnology.
4.1 Definition
A metrological atomic force microscope (mAFM) differs from a traditional AFM (same operating principle)
The Ultimate Scientific and Technical Reference
This article is included in
Mechanical and dimensional measurements
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Metrological atomic force microscope
LNE's metrological AFM
Bibliography
- (1) - The Royal Society & The Royal Academy of Engineering - Nanoscience and nanotechnologies : opportunities and uncertainties - http://www.nanotec.org.uk/finalReport.htm (juillet 2004).
- (2)...
The Ultimate Scientific and Technical Reference
