4. Metrological atomic force microscope
At the nanometer scale, the metrological atomic force microscope is the means of connecting dimensional measurements to the International System of Units. It acts as a link between the users of near-field microscopes at the base of the traceability pyramid and the unit of length at the top of the pyramid. It is a measuring instrument dedicated to the calibration of transfer standards used in the field of nanoscience and nanotechnology.
4.1 Definition
A metrological atomic force microscope (mAFM) differs from a traditional AFM (same operating principle)
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Metrological atomic force microscope
LNE's metrological AFM
Bibliography
- (1) - The Royal Society & The Royal Academy of Engineering - Nanoscience and nanotechnologies : opportunities and uncertainties - http://www.nanotec.org.uk/finalReport.htm (juillet 2004).
- (2)...
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