Français
1. Instrumentation and operating modes
1.1 Microscope
A typical force microscope schematic is shown in figure 1 . A miniature tip, attached to the end of a cantilever, is brought close to the surface of a sample placed on a displacement stage (XYZ scan). The relative displacement of the tip with respect to the sample provides either a map of the measured quantity, or an "isograndeur" surface, if a servo loop adjusts the sample height to keep the measured quantity constant.
the English term cantilever refers to a point suspended in a cantilevered fashion.
The deflection or torsion of the spring under the effect of the interaction...
The Ultimate Scientific and Technical Reference
This article is included in
Mechanical and dimensional measurements
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Instrumentation and operating modes
Applications
Bibliography
References
Manufacturers, constructors (non-exhaustive list)
Thermal mode microscope
Organizations
French national metrology and testing laboratory (LNE)
Russian Society of Scanning Probe Microscopy and Nanotechnology
The Ultimate Scientific and Technical Reference
