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2. Applications
The ability to study surfaces with extreme resolution using atomic force microscopy techniques has led to the emergence of a wealth of related techniques using locally interacting probes. The world of local detection techniques and AFM-type microscopy is described in figure 18 .
2.1 Local properties
The ability of the AFM to measure locally weak forces...
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Applications
Conclusion
Bibliography
References
Manufacturers, constructors (non-exhaustive list)
Thermal mode microscope
Organizations
French national metrology and testing laboratory (LNE)
Russian Society of Scanning Probe Microscopy and Nanotechnology
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