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3. Sample preparation
3.1 Metallic materials
The current metal sample is solid, a very good electrical and thermal conductor, and non-volatile. It is therefore easy to observe significant micro-relief on these materials:
breaks ;
machined or corroded surfaces ;
surface deposits ;
of polished and etched sections in much the same way as in optical metallography, the etching creating a significant micro-relief of the microstructure through preferential dissolution of the various phases and/or accentuated dissolution at the interfaces (grain boundaries and phase boundaries);
of unetched polished sections (in backscattered or absorbed...
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Sample preparation
Developments in scanning electron microscopy
Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy: - ISO TC202 -
TC202/SC1: terminology
TC202/SC2: electron probe microanalysis
TC202/SC3: analytical electron microscopy
TC202/SC4: scanning electron microscopy.
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Organizations – Federations – Association (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS: European Microbeam...
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