Français
5. Applications
5.1 Materials engineering
5.1.1 Observation of microstructures
Scanning electron microscopy (SEM) routinely enables high magnification observation of the microstructures of materials prepared by polishing and appropriate etching. In most cases, metallographic etching hollows out grain boundaries and interfaces between phases, and/or dissolves each phase differently. It thus creates a significant micro-relief, easily observable with secondary electron imaging. In this way, it complements optical microscopy to distinguish...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Applications
Conclusion
Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy: - ISO TC202 -
TC202/SC1: terminology
TC202/SC2: electron probe microanalysis
TC202/SC3: analytical electron microscopy
TC202/SC4: scanning electron microscopy.
Directory
Organizations – Federations – Association (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS: European Microbeam...
The Ultimate Scientific and Technical Reference
