Français
6. Conclusion
Scanning electron microscopy is a powerful tool for observing surfaces. It is commonly used to image surfaces simultaneously from secondary electrons, with great depth of field and excellent separating power at magnifications of the order of 10 to 100,000 and more.
SEM images (SE, BSE, in-lens) can easily be combined with microanalyses and elemental mapping, obtained by X-ray spectrometry (EDS), such as orientation mapping (EBSD). These are all now digitized, and are particularly well suited to image processing.
A wide range of equipment is available, broadly classified into four families:
conventional scanning electron microscopes (W filament or LaB6), where the entire column is placed in a high vacuum, and whose maximum performance depends above all on the type of electron source used;...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Conclusion
Glossary
Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy: - ISO TC202 -
TC202/SC1: terminology
TC202/SC2: electron probe microanalysis
TC202/SC3: analytical electron microscopy
TC202/SC4: scanning electron microscopy.
Directory
Organizations – Federations – Association (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS: European Microbeam...
The Ultimate Scientific and Technical Reference
