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4. Conclusion
For many years, scanning electron microscopy saw few major upheavals, but the development of field emission guns (mainly Schottky emission) changed the technique considerably. The development of new electron column concepts and detectors has extended the capabilities of these microscopes, particularly in terms of imaging resolution, but also in terms of observation capabilities at low and very low voltages, or using detectors located in the SEM column. On the other hand, contrast interpretation has often become more complex, as secondary and backscattered electronic emissions no longer follow the same rules at low voltages as they do at higher voltages
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Conclusion
Glossary
Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy - ISO TC202 -
- Terminologie - TC202/SC1 -
- Microanalyse par sonde à électrons - TC202/SC2 -
- Microscopie analytique à électrons - TC202/SC3 -
- Microscopie électronique à balayage - TC202/SC4 -
Directory
Organizations – Federations – Associations (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, GNMEBA publications available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS:...
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