Overview
FrançaisABSTRACT
This article focuses on near-field or local probe microscopy. This type of microscopy is based on the detection of a physical property on the surface (such as an electric current, a force or photons) at the local scale. Its principle is very different from that of the classic microscope: a tip collects information on the extreme surface of the sample. The technique has evolved considerably since the emergence of nanotechnologies and provides today many answers about the properties of materials at the molecular or atomic level.
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Read the articleAUTHORS
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Agnès PIEDNOIR: CNRS Research Engineer - Institut Lumière Matière, Villeurbanne, France
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David ALBERTINI: CNRS Research Engineer - Lyon Nanotechnology Institute, Villeurbanne, France
INTRODUCTION
The appearance of the scanning tunnelling microscope in 1982 revolutionized the field of microscopy, introducing the concept of near-field microscopy, the basis for local probe microscopes. Different in principle from traditional microscopies, local probe (or near-field) microscopies have developed from the scientific and technical advances of scanning tunnelling microscopy. They all involve scanning a probe tip close to a sample, and provide images that are very high-resolution mappings of specific properties of the sample surface, depending on the type of probe used. Various properties (structural, electronic, chemical, optical, etc.) and their local variations at nanometric or sub-nanometric scales can be imaged and studied. Thanks to their high resolution power, local probe microscopies provide new insights and complement conventional microscopies for studying matter down to the atomic scale.
In the 2020s, after several decades of development, many research and industrial laboratories are using these observation and analysis instruments. They can be used to study the local properties of surfaces (or interfaces) under a wide variety of conditions, depending on the application: ultra-high vacuum for surface physicochemistry, liquid media for biology and electrochemistry, controlled atmosphere for all kinds of materials and for metrology. Table 1 provides a non-exhaustive list of near-field microscopes that can be used to access the characteristic local properties of a sample.
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KEYWORDS
microscopy | tunneling current | atomic force | atomic resolution | local spectroscopy
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Local probe microscopy
Bibliography
Bibliography
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
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BUY an AFM – Photoniques 90 (2018). A list of microscope manufacturers and tip manufacturers/distributors is available.
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