Article | REF: P895 V3

Local Probe Microscopy

Authors: Agnès PIEDNOIR, David ALBERTINI

Publication date: June 10, 2023

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3. Atomic force microscopy and force microscopy

History

The Atomic Force Microscope (AFM) was born in 1986 from the need to image all types of samples, not just conductors and semi-conductors, by probing forces between tip and surface . By measuring and controlling these forces, a suitable microscope should be able to image surface topography and also study other physical phenomena on the nanometric scale. The AFM, based on this objective, borrows from STM technology the system of nanometric displacements and regulation of relative tip-surface displacement at constant force (in place of current for the STM). The setpoint is the force applied by the fine tip to the scanned surface.

The...

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Atomic force microscopy and force microscopy