Overview
FrançaisRead this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.
Read the articleAUTHORS
-
Jean-Pierre SCHERMANN: Professor at Université Paris-Nord
-
Michel VEDEL: Senior Lecturer at Aix-Marseille I University
INTRODUCTION
Ion confinement uses two main techniques. The first relies on the combined action of a magnetic field and an electrostatic field. The Penning trap is one example. The second uses purely electric fields and gave rise to the Paul trap.
Containment devices offer greater sensitivity than competing devices, thanks to their ability to accumulate charges created in situ, and to the long interaction times made possible by storage. Thus, the very first applications of confinement devices, whether "magnetic" or "radio-frequency", involved the production of highly sensitive vacuum gauges. For the study of reactive collisions, the possibility of creating an ion target whose interaction with a gas can be studied makes it possible to create a device that competes with traditional methods based on the study of the interaction of an ion beam with a gas target.
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Ion trapping techniques
Bibliography
In Engineering Techniques
- (1) - BOUCHOUX (G.), SABLIER (M.) - Spectrométrie de masse. - , , traité Analyse et Caractérisation (2006).
General articles on ion trap mass spectrometry
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference