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Article | REF: M4135 V1

Study of metals by transmission electron microscopy (TEM)

Authors: Miroslav KARLÍk, Bernard JOUFFREY

Publication date: September 10, 2008

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4. Diffraction contrast

Two-wave imaging diagram
Figure 5  -  Two-wave imaging diagram

Diffraction contrast arises from local variations in the intensity of the electron beams diffracted by the sample. It is strongly dependent on the inclination of the studied crystal with respect to the incident beam. To observe crystal defects, the sample is tilted to a position close to the Bragg angle. However, due...

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