Article | REF: M4135 V1

Study of metals by transmission electron microscopy (TEM)

Authors: Miroslav KARLÍk, Bernard JOUFFREY

Publication date: September 10, 2008

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5. Phase contrast

Interference effects (phase effects) form the basis of atomic resolution imaging and electron holography. A large contrast diaphragm is used, allowing several beams to pass through (figure 1 b), and the image results from their interference. The diffracted waves are π/2 out of phase with the incident wave. However, by defocusing the lens (underfocusing, i.e. focusing above the object by a precise amount), an additional phase shift of π/2 with respect to the transmitted beam is introduced into the diffracted beams, which will compensate for the phase shift due to sphericity aberration. It is at this defocus, known as...

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Phase contrast