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4. Characterization of defects
4.1 Image of a dislocation (contrast optimization)
Channelling is achieved for a family of hkl planes when the untilted incident beam falls on the edge of the band (hkl), ideally for s > 0 and far from the intersection of another band edge so that only one diffraction condition is satisfied .
Dislocation images often have a bright side and a dark side (figure
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Characterization of defects
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