Overview
ABSTRACT
Defects play an important role in the properties of solids. The effects of defects in solids, whether positive or negative, are a key issue for the control and optimization of materials. Raman spectroscopy is an analysis tool that allows the study of a structure via the characterization of molecular vibrations. This article describes the effects that defects cause in Raman spectra: changes in the lines specific to the host, occurrence of new lines, or activation of lines in principle forbidden by the Raman selection rules.
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Read the articleAUTHORS
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Marc D. FONTANA: University Professor - Optical Materials, Photonics and Systems Laboratory (LMOPS EA 4423), University of Lorraine & CentraleSupélec, Metz, France
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David CHAPRON: Senior Lecturer - Optical Materials, Photonics and Systems Laboratory (LMOPS EA 4423), University of Lorraine & CentraleSupélec, Metz, France
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Thomas H. KAUFFMANN: Research Engineer - Optical Materials, Photonics and Systems Laboratory (LMOPS EA 4423), University of Lorraine & CentraleSupélec, Metz, France
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Patrice BOURSON: University Professor - Optical Materials, Photonics and Systems Laboratory (LMOPS EA 4423), University of Lorraine & CentraleSupélec, Metz, France
INTRODUCTION
Raman spectroscopy is a tool for physicochemical analysis of a wide variety of media (solid or liquid, organic or mineral, semiconductor or insulator, crystal or glass, polymer, etc.), providing information on structure: chemical bonds, crystalline arrangement, symmetry, phase... As such, the Raman spectrum provides a fingerprint of the compound analyzed, enabling identification of a substance in a mixture or heterogeneous material. As a result, it is used in a wide range of applications: chemistry, biology, physics, archaeology and even on Mars.
As the structure of a medium is sensitive to the environment (stress, temperature, etc.), Raman spectroscopy can also be used to extract a physical parameter external or internal to the medium: deformation, concentration and composition of a product, characteristics of a phase transition, degree of order of a structure, anharmonicity, and so on. The term "Raman sensor" is becoming increasingly popular. For this purpose, it is possible to take advantage of one or other of the characteristics of a Raman line: position of the maximum, width and intensity. Raman spectroscopy can also be used for multi-scale studies, thanks to the judicious choice of optical elements during measurement.
Recent technological innovations (lasers, rejection filters, detectors) have given Raman spectroscopy numerous advantages for both surface and volume measurements. The miniaturization of instruments has made it possible to diversify products (transportable and portable devices) and applications, which ten years ago were confined almost exclusively to laboratory research.
Raman spectroscopy is a non-destructive and non-invasive technique, enabling measurements both through a container and remotely via optical fibers, with timescales compatible with chemical reactions or industrial processes. As a result, it is now perfectly suited to studies in industrial environments, particularly in situ analyses, and even in hostile environments. In addition, ongoing improvements in data processing capabilities via software (e.g. chemometrics) are opening up major fields of study in real time. This has also led to significant progress in mapping studies, making Raman imaging much more readily available. Raman spectroscopy is therefore naturally a technique of choice for defect studies, providing useful information on dopant incorporation and localization, phase mixing, inhomogeneity and so on. This enables us to better understand and control the properties of materials, or to optimize the manufacturing process.
The aim of this article is to describe and explain the various possible effects of defects on the Raman spectra of solid materials. In the first part, the fundamental principles governing Raman spectroscopy...
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KEYWORDS
defects | Raman Spectroscopy | polymers | optical materials
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Raman spectroscopy of defects in materials
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LMOPS – Optical Materials, Photonics and Systems Laboratory
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