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2. Techniques for measuring nano-object size
2.1 Direct methods
Microscopy techniques such as atomic force microscopy (AFM), scanning electron microscopy (SEM) or transmission electron microscopy (TEM) are the only so-called "direct" techniques, since the measurement principle is based on direct observation of the nanoparticle, and the measurement produced is a "geometric" size directly traceable to the unit of length, the meter. The notion of traceability will be defined in the 3.3
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Techniques for measuring nano-object size
Size measurement by atomic force microscopy (AFM)
Bibliography
Standards and norms
National standards
- Nanotechnologies – Vocabulary – Part 1: core terms. - XP CEN ISO/TS 80004-1 - 2015
- Nanotechnologies – Guidelines for the physico-chemical characterization of manufactured nano-objects in toxicological tests. - ISO/TR 13014 - 2012
- Rectificatif technique 1 à la norme ISO/TR 13014 de mai 2012. - ISO/TR 13014/AC1 -...
International standards
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