Article | REF: R6737 V1

Hybrid AFM/SEM metrology for measuring nanoparticle dimensions

Authors: Loïc CROUZIER, Nicolas FELTIN, Alexandra DELVALLÉE

Publication date: December 10, 2020

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

2. Techniques for measuring nano-object size

2.1 Direct methods

Microscopy techniques such as atomic force microscopy (AFM), scanning electron microscopy (SEM) or transmission electron microscopy (TEM) are the only so-called "direct" techniques, since the measurement principle is based on direct observation of the nanoparticle, and the measurement produced is a "geometric" size directly traceable to the unit of length, the meter. The notion of traceability will be defined in the 3.3

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Nanosciences and nanotechnologies

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Techniques for measuring nano-object size
Outline