3. Other contact microscopies

3.1 Lateral force microscope (LFM)

For low-fragility materials, Lateral Force Microscopy (LFM) can be used to visualize areas of differing friction coefficients on the surface of heterogeneous materials [7] ; the image is obtained by measuring the tangential component of the tip-surface interaction force (figure 7 a ).

As the sample is scanned, the spring undergoes torsion in addition to vertical deflection. The deflection of the spring causes a vertical displacement of the laser beam reflected by the mirror (figure

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Other contact microscopies

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page Conventional contact microscopy (AFM)

Microscopy in non-contact (or resonant) mode

References

(1) - BINNIG (G.), QUATE (C.F.), GERBER (C.) - Atomic force microscope. - Phys. Rev. Lett., 12, p. 930-933 (1986).
(2) - MIZES (H.A.), LOH (K.J.), MILLER (R.J.P.), AHUJA (S.K.), GRABOWSKI (E.F.) - Submicron probe of polymer adhesion with atomic force microscopy....