4. Microscopy in non-contact (or resonant) mode
To avoid tip-surface friction and image the surface of fragile materials, the resonant (non-contact) microscope was developed at virtually the same time as the "classic" contact-mode atomic force microscope
Instead of measuring static spring deflections, as in the contact mode (AFM), the spring is forced to oscillate at a frequency close to its natural frequency, with a low amplitude (a few nanometers). In the presence of the interaction force, or more precisely the force gradient, dF/dz, the spring's effective stiffness constant...
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Microscopy in non-contact (or resonant) mode
References
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Advanced Technologies Center (ATC) http://www.nanoscopy.net
Elexience http://www.elexience.fr
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