2. Conventional contact microscopy (AFM)

For the sake of clarity, the operating principle of the atomic force microscope will be developed here in the case of the contact-mode atomic force microscope, developed by Binnig, Quate and Gerber in 1986. Later versions of the atomic force microscope will then be described more briefly, with application examples.

AFM surface normal force measurement — Figure 3...

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Conventional contact microscopy (AFM)

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Other contact microscopies

References

(1) - BINNIG (G.), QUATE (C.F.), GERBER (C.) - Atomic force microscope. - Phys. Rev. Lett., 12, p. 930-933 (1986).
(2) - MIZES (H.A.), LOH (K.J.), MILLER (R.J.P.), AHUJA (S.K.), GRABOWSKI (E.F.) - Submicron probe of polymer adhesion with atomic force microscopy....