Article | REF: R6331 V1

Speckle interferometry

Author: Paul SMIGIELSKI

Publication date: March 10, 2001

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


Français

2. Speckle interferometry: measuring in-plane displacements

2.1 Principle

The object is illuminated symmetrically with parallel laser light (figure 6 ). A photographic lens L forms an image of the object on a photosensitive medium H (usually film or a photographic plate, or a CCD camera) .

speckle interferometry with symmetrical...
You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!


The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Non-destructive testing

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Speckle interferometry: measuring in-plane displacements