Français
1. Reminder of S parameters
Scattering parameters (S-parameters) are undoubtedly one of the most important tools in the design, construction and characterization of microwave devices. S-parameters can be measured simply using a vector network analyzer (VNA). When the latter is rigorously calibrated, the measured S-parameters represent the intrinsic properties of the device, independent of the VNA used to characterize it. Indeed, thanks to calibration procedures, it is possible to eliminate systematic errors due to the VNA and extract all the parameters that determine the device's behavior, such as gain, losses and reflection factor, independently of the measurement system.
1.1 Properties and limitations
An important property of a device's S-parameters is that they can be determined from...
The Ultimate Scientific and Technical Reference
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Reminder of S parameters
Non-linear device problem
Bibliography
Websites
The OpenWave Forum (OWF): http://www.openwaveforum.org/ (page consulted on June 26, 2017)
Patents
Method for generating a circuit model, US 7295961 B2, November 13, 2007
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Keysight Technologies :
Maury Microwave :
https://www.maurymw.com/MW_RF/
NMDG :
The Ultimate Scientific and Technical Reference
