Article | REF: R1080 V2

Measuring electronic components - Part 3: measuring active components

Authors: Patrick POULICHET, Gilles AMENDOLA, Christophe DELABIE, Yves BLANCHARD

Publication date: June 10, 2009

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1. Discrete active components

Discrete" active components are elementary components such as diodes, transistors, thyristors, triacs, etc., encapsulated in a housing that allows them to be assembled individually.

These components are measured in two ways:

  • so-called "static" measurements are used to record or test their current-voltage characteristic (for diodes) or current-voltage as a function of base current (for bipolar transistors);

  • dynamic measurements: these concern the "small signal" parameters of these devices, such as dynamic resistance, transconductances, h-parameters, S-parameters (see article [R 1 078v2] ).

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