Article | REF: R1080 V2

Measuring electronic components - Part 3: measuring active components

Authors: Patrick POULICHET, Gilles AMENDOLA, Christophe DELABIE, Yves BLANCHARD

Publication date: June 10, 2009

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2. Testing operational amplifiers and comparators

Like other semiconductors, operational amplifiers and comparators are defined by their static, functional and dynamic parameters (table ).

The measurement device shown in figure is dedicated to measuring the open-loop gain of AOP. In fact, if the gain of the measuring amplifier (Ampli) is greater than a few 10 5 the "+" and " – " inputs are at the same potential (to within a few μV). Then :

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Testing operational amplifiers and comparators