![](/assets/images/picto-drapeau-france-3a76576a5d60a512053b4612ab58dae5.png)
1. Current measurement
1.1 Introduction
1.1.1.1 MOS structure and dielectric breakdown
Measuring the transport properties of nano-objects (nanocrystals, nanowires, extremely thin films, etc.) is of crucial importance both in fundamental physics, for understanding...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
![](/assets/images/logo-eti-286623ed91fa802ce039246e516e5852.png)
The Ultimate Scientific and Technical Reference
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Current measurement
Bibliography
Websites
ITRS – International Technology Roadmap for Semiconductors
Industrial and academic players
The Club nanoMétrologie was responsible for writing this article:
...Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
![](/assets/images/logo-eti-286623ed91fa802ce039246e516e5852.png)
The Ultimate Scientific and Technical Reference