Overview
FrançaisRead this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.
Read the articleAUTHORS
-
Matteo VALENZA: Professor at the University of Montpellier II
-
Fabien PASCAL: Professor at the University of Montpellier II
-
Alain HOFFMANN: Professor at the University of Montpellier II
INTRODUCTION
This text should be read in conjunction with the dossier . Four objectives are developed in these files.
The first objective is the subject of the .
The second objective is to present the background noise that attaches to the main basic electronic components, both passive and active: resistors and sensors, different types of transistors and linear integrated circuits 1 ;
The third objective is to raise awareness of the various methods of measuring background noise and the accuracy of the measurements involved (§ 2 , § 3 );
Last but not least, the purpose of these files is to make the reader fully aware of the importance of background noise in measurement techniques, and the importance of mastering its knowledge in the components and circuits used or chosen when designing low-noise electronic circuits 4
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Electronic measurements and tests
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Background noise and measurements
Bibliography
References
Suppliers
(non-exhaustive list)
Synergie Concept, à Meylan http://www.synergie-concept.fr
HTDS, à Massy http://www.htds.fr
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference