3. Challenges and latest trends
3.1 Challenges
The techniques described above enable thermal characterization of materials and devices at micrometric and nanometric scales. However, these measurements are difficult to trace in the metrological sense [JCGM 200:2012], and are sometimes more qualitative than quantitative. Depending on the information required, extensive measurement and calibration protocols may be necessary. If the aim is to compare measurements or observe an evolution, a simple sensitivity study may be sufficient to...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Mechanical and dimensional measurements
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Challenges and latest trends
Bibliography
Standards and norms
- Fine ceramics (advanced ceramics, advanced technical ceramics) – Determination of thermal diffusivity of monolithic ceramics by laser flash method ISO 18755 - ISO 18755 - 2005
- Standard Test Method for Thermal Diffusivity by the Flash Method ASTM E1461-07. - ASTM E1461-07 -
- International Vocabulary of Metrology – Fundamental and general concepts and associated terms (VIM), JCGM 200:2012, BIPM, 3rd edition,...
Patents
Optical heterodyne sampling device, PCT/FR2006002384; FR0510776; US2008251740A1; AT425445T; JP2009512848A; WO2007045773A1; EP1949055A1; FR2892511A1, 2006.
Directory
Organizations – Federations – Associations (non-exhaustive list)
Center national de compétences en Nanosciences du CNRS, C'Nano – CNRS
Laboratoire national de métrologie et d'essais, LNE
...
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference