4. Ion impact localization and image reconstruction

4.1 Impact location

3D atomic probes owe their development to a position-sensitive, time-resolved detector. In addition to time of flight, the detector provides the position of ion impacts (X, Y ). Depending on the detector used, localization accuracy can reach 100 μm. Various technologies have been developed since the first instruments were introduced in the 1990s. Today's detectors consist of a set of two crossed delay lines (coiled lines, figure 5 ). These are placed behind a pair of microchannel wafers (charge amplifiers) that transform the impact of an ion (q = ne with n = 1, 2, 3...) into a spray of electrons (n = some 10 ⁷ ) that irradiates...

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!

The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors

+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year

From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Mechanical and dimensional measurements

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Ion impact localization and image reconstruction

Previous
page Evaporation mode and mass resolution

Spatial resolution

Bibliography

(1) - BRANDON (D.G.) - On field evaporation. - Philosophical Magazine, 14, p. 803-820 (1966).
(2) - TSONG (T.T.) - Field ion image formation. - Surface Science, 70, p. 211-233 (1978).
(3)...

Patents

Atomic Tomographic Wide Angle Laser Probe with very high mass resolution, BOSTEL Alain , DECONIHOUT Bernard , YAVOR Mickael , RENAUD ludovic, Date de dépôt 12/10/2007 Numero INIST 07 07178

Wide Angle Atomic Tomographic Probe with evaporation assisted by a "white" femtosecond laser pulse, DECONIHOUT Bernard, VELLA Angela, Francois Vurpillot, BREVET INTERNATIONAL n WO/2010/000574 Application number int:...