Article | REF: P2756 V1

Spark-source optical emission spectrometry (part 2)

Author: Raymond MEILLAND

Publication date: December 10, 2005

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 INTRODUCTION

The development of optical emission spectrometry (OES) has led many manufacturers to enter the emission spectrometer market. Since market share is not always sufficient to ensure the survival of each company, they have often supplemented their production with equipment for ICP (inductively coupled plasma), X-ray fluorescence, atomic fluorescence, atomic absorption, etc.

The performance of spark-ignition optical emission spectrometers has evolved considerably, particularly in terms of low-level analysis and improved accuracy and detection limits.

What's more, although competition between manufacturers is always real when it comes to hardware, it's above all in the field of information processing software that there are differences. The power of computers means that mathematical models can be used to solve complex problems relating to inter-element effects and overlapping lines. Spectral information processing has become a technique in itself.

The first part is covered in the .

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Spark-source optical emission spectrometry (part 2)