9. Outlook: sub-micron analysis
The main limitation of microanalysis on massive targets lies in its spatial resolution. While in SIMS it can reach 25 nm (NanoSIMS) and in Auger only a few nanometers, it typically remains in the micrometer range.
Two factors limit spatial resolution: probe diameter d
0
and, above all, electron scattering (cf.
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Outlook: sub-micron analysis
Also in our database
Bibliography
General works In French
Directory
Manufacturers – Distributors – Suppliers
EDS spectrometers
Bruker represented in France by Synergie4 http://www.bruker.comhttp://www.synergie4.com
Edax, represented in France by Eloïse
http://www.edax.com
Exclusive to subscribers. 97% yet to be discovered!
You do not have access to this resource.
Click here to request your free trial access!
Already subscribed? Log in!
The Ultimate Scientific and Technical Reference