5. Analysis of stratified samples

While conventional quantification procedures require a homogeneous sample in the analysis volume, f ( ρz ) models make it possible to analyze stratified samples, i.e. a succession of thin layers of constant thickness, with a total thickness of no more than a few microns.

For a layer buried between depths ρz _i and ρz _i+1 containing element A, we can, by definition of f (ρz ), write that the characteristic emergent intensity of the element under consideration coming from layer i is equal to :

\begin{array}{l} I_{film}^{i} = C_{A} C^{te} \begin{matrix} j=i − 1 \\ j= 1 \end{matrix} exp [- (χ_{A}^{i} - χ_{A}^{j}) Δ ρ z_{j}] \\ \begin{matrix} ρ z_{i + 1} \\ ρ z_{i} \end{matrix} ϕ_{A} (ρ z) exp [- χ_{A}^{i} ρ z] d ρ z \end{array}

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Bibliography

General works In French

(1) - MAURICE (F.), MENY (L.), TIXIER (R.) - Microscopie électronique à balayage et microanalyses. - École d'été de Saint-Martin d'Hères (1978), Les Éditions de physique (épuisé) (1979).
(2) - GN-MEBA, BRISSET (F.) - Microscopie...